Advances in Imaging and Electron Physics
222,00 €*
Sofort verfügbar, Lieferzeit: 1-3 Tage
Produktnummer:
9780123813107
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
| EAN: | 9780123813107 |
|---|---|
| Sprache: | Englisch |
| Produktart: | Gebunden |
| Herausgeber: | Hawkes, Peter W. |
| Verlag: | Academic Press Elsevier Science & Technology |
| Untertitel: | Theory of Intense Beams of Charged Particles |
| Schlagworte: | TENSOR |
| Größe: | 229 × 152 × 38 |
| Gewicht: | 1299 g |
